Commitment to the achieving the highest accuracy in manufacturing led to Tannlin’s decision to invest in a Scanning Electron Microscope (SEM). The instrument, a Hitachi TM3030Plus Table Top Microscope, allows magnification of ×15 to ×60,000 (Up to ×240,000 with digital zoom) and Roughness Analysis. The addition of the SEM will allow Tannlin to measure within sub micron parameters, rigorously inspect laser cut edges and take detailed, three dimensional images.

The image featured above was taken on the SE Microscope and depicts a sample single lamination that was cut for Southern Manufacturing. Find out more about micron precise engineering here.